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Course Detail

Degree
Master
Standard Academic Year
1, 2
Course delivery methods
face-to-face
Subject
Physical sciences, Mathematical sciences
Program
School
Master's Program in Engineering Sciences
Department
Master's Program in Engineering Sciences
Campus
Tsukuba Campus
Classroom
3Z0110
Course Offering Year
2023-2024
Course Offering Month
April - June
Weekday and Period
Thu4
Capacity
Credits
1.0
Language
English
Course Number
0AJJA01

Scanning Electron Microscope University of Tsukuba

Course Overview

Observation is the first step in research, and we observe samples before most experiments. In nano-science, electron microscopy is a powerful tool, as the objects of observation are sub-micron in size and beyond the resolution limits of optical microscopy. In this course, we will study the history of scanning electron microscope (SEM), and its instrumentation and principles. The interaction between electrons and materials will be reviewed, and the generation, transport, and detection of secondary and reflected electrons will be understood. Furthermore, the information contained in SEM signals will be organized and observation methods will be studied. In the latter half of the course, not only the signal of electrons, but also compositional analysis using X-rays and functional evaluation using luminescence will be introduced, and applications to materials science and recent developments in SEM will be summarized.

Learning Achievement

Understanding the operation method of the scanning electron microscope (SEM) and becoming able to set a condition of the electron microscopy. Being able to obtain the information about materials from an electron microscope image.

Competence

This class corresponds to "foster scholastic ability and high level professionals".

Course prerequisites

Grading Philosophy

Students will be evaluated based on reports after each lecture and a final report.

Course schedule

1. Introduction
2. Instrument
3. Electron beam & Material interaction
4. Application 1 : Metal, Semiconductor
5. Application 2 : Insulator, Nano-structure
6. X-ray analysis (EDX & WDX)
7. Auger Spectroscopy
8. Simulation
9. Semiconductor measurement SEM
10. EBSD, STEM
導入
走査電子顕微鏡装置概要
電子と物質の相互作用
金属と半導体への応用
絶縁体とナノ構造への応用
EDXとWDX
Auger分光、カソードルミネセンス、EBIC
電子ビーム軌道のシミュレーション
半導体測長用走査電子顕微鏡
EBSDとSTEM
Lectures will be given in face-to-face classes (Laboratory of Advanced Research B 0110).

Course type

Lectures

Online Course Requirement

Instructor

Sohda Yasunari,Sekiguchi Takashi

Other information

01BF260 and equivalence.

Site for Inquiry


Link to the syllabus provided by the university