Course Overview

> The learning objectives of the course including:

- Being able to classify the major classes of physical and chemical
characterizations according to the different interactions of radiation
with matter
- Knowing surface characterization methods such as electron
microscopy
- Being able to use a space group from the “International Tables
for Crystallography” to describe a crystal structure
- Knowing X-ray diffraction on powder: theory, calculation of
diffractions patterns (position and intensity of peaks), crystallite
size.
- Knowing X-ray diffraction of single-crystals: theory, determination
of space group, introducing to phase problem.

Learning Achievement

Competence

Course prerequisites

- Academic level: BSc
- Language prerequisites: English or French.
- Selection procedure: evaluation of the student's CV
- Selection  criteria: Basic knowledge in chemistry and/or physical
chemistry

Grading Philosophy

> First session (takes place in December)

- 10% of the overall mark : written report for the evaluation of the
practical sessions - 10% of the overall mark : 2 written tests in
October (15 mn/test) - 40% of the overall mark : written test in
November (1h30) - 40% of the overall mark : written test in December
(1h30)

> Second session 

In case of failure, a second session is organized, either as a written
or an oral exam depending on the number of failed students. This 2nd
session takes place at the end of June.

- 10% of the overall mark : written report for the evaluation of the
practical sessions (the mark is kept from the first to the second
session) - 90% of the overall mark : written test (3 hours) or oral
examination (40 mn)

Course schedule

PART 1: SYMMETRY AND CRYSTALLOGRAPHY
_A. Periodic atomic arrangemen_
> Symmetry Elements. Periodic atomic arrangement
> Crystallographic point groups
> Space group, International Tables for Crystallography _
_
_B. X-ray diffraction_
> General skills: production, detectors, protection, equipment, etc.
> Interaction of X-ray with matter
> Direct and reciprocal space
> Laue conditions
> Diffusion, structure and form factors
> X-ray diffraction on powder: Analysis of powder patterns.
> Rietveld refinement, crystallite size (from Scherrer to
Warren-Averbach
> X-ray diffraction on single-crystal : space group determination,
solving of phase problem (direct method, Patterson method)
> Diffractometers
_C. Practical session_

- Study of the structure from a cif file for a given compound.
- Calculation of precession images, calculation of structure factors.

PART 2 : SURFACE ANALYSIS
> Introduction
> Optical microscopy: principles & techniques
> Electron microscopy: principles & techniques

- Transmission electron microscopy
- Scanning electron microscopy

> Near field microscopy techniques

- Scanning Tunnel Microscopy
- Atomic Force Microscopy

> Photo-electrons spectroscopies: UPS and XPS.
> Auger and X fluorescence spectroscopies

Course type

- Lectures and tutorials (taught in English): 32 lectures of 1h20. - Practical session (English): 2 sessions of 4 hours. - Teaching supports available on the Moodle platform - 105 self-study hours: (50 hours private reading, 20 hours exam preparation, 20 hours exercise preparation, 15 hours preparation/report of practical session.

Online Course Requirement

Instructor

Other information

Language of instruction: English
Mode of delivery: Face-to-face teaching

Site for Inquiry